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Physical principles of electron microscopy : an introduction to TEM, SEM and AEM Ray F. Egerton

By: Material type: TextTextPublication details: New York Springer 2010Description: xii,202p.:ill.; 23cmISBN:
  • 978-1-4419-3837-4
Subject(s): DDC classification:
  • 23rd. 502.825
Online resources:
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Holdings
Item type Current library Collection Call number Copy number Status Date due Barcode Item holds
Books Books North Eastern Hill University BASIC SCIENCE 502.825 (Browse shelf(Opens below)) Available 301214
Books Books North Eastern Hill University BASIC SCIENCE 502.825 (Browse shelf(Opens below)) ;1 Available 301215
Total holds: 0

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