Physical principles of electron microscopy : an introduction to TEM, SEM and AEM (Record no. 157286)

MARC details
000 -LEADER
fixed length control field 00460nam a22001457a 4500
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 978-1-4419-3837-4
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Edition number 23rd.
Classification number 502.825
100 ## - MAIN ENTRY--AUTHOR NAME
Personal name Egerton, Ray F.
245 ## - TITLE STATEMENT
Title Physical principles of electron microscopy : an introduction to TEM, SEM and AEM
Statement of responsibility, etc Ray F. Egerton
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication New York
Name of publisher Springer
Year of publication 2010
300 ## - PHYSICAL DESCRIPTION
Number of Pages xii,202p.:ill.;
Dimensions 23cm.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Electron microscopes
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Electron microscopy
856 ## - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier www.springeronline.com
Holdings
Withdrawn status Lost status Damaged status Collection code Home library Current library Date acquired Full call number Accession Number Koha item type Copy number
      BASIC SCIENCE North Eastern Hill University North Eastern Hill University 11/07/2013 502.825 301214 Books  
      BASIC SCIENCE North Eastern Hill University North Eastern Hill University 11/07/2013 502.825 301215 Books ;1