000 00460nam a22001457a 4500
020 _a978-1-4419-3837-4
082 _223rd.
_a502.825
100 _aEgerton, Ray F.
245 _aPhysical principles of electron microscopy : an introduction to TEM, SEM and AEM
_cRay F. Egerton
260 _aNew York
_bSpringer
_c2010
300 _axii,202p.:ill.;
_c23cm.
650 _aElectron microscopes
650 _aElectron microscopy
856 _uwww.springeronline.com
999 _c157286
_d157286