000 00321nam a2200097Ia 4500
008 120224s9999 xx 000 0 und d
082 _a543
_bINT
100 _aInternational Symposium on Trace analysis and technological
245 _aTrace analysis and technology development
260 _bWiley Eastern
_aNew Delhi
_c1983
999 _c142798
_d142798