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Statistical analysis of reliability and life-testing models : theory and methods Lee J. Bain, Max Engelhardt.

By: Contributor(s): Material type: TextTextSeries: Statistics, textbooks and monographs ; v. 115.Publication details: New York : M. Dekker, c1991.Edition: 2nd edDescription: vii, 496 p. : ill. ; 24 cmISBN:
  • 0824785061
Subject(s): DDC classification:
  • 23rd 620.00452015195 BAI
Online resources:
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Holdings
Item type Current library Collection Call number Copy number Status Date due Barcode Item holds
Books Books North Eastern Hill University General Stacks BASIC SCIENCE 620.00452 015195 BAI (Browse shelf(Opens below)) ,1;1 Available 301266
Books Books North Eastern Hill University General Stacks BASIC SCIENCE 620.00452 015195 BAI (Browse shelf(Opens below)) ,1;2 Available 301267
Books Books North Eastern Hill University General Stacks BASIC SCIENCE 620.00452 015195 BAI (Browse shelf(Opens below)) ,1;3 Available 301268
Books Books North Eastern Hill University General Stacks STATISTICS 620.00452015195 BAI (Browse shelf(Opens below)) ,1 Available 281022
Total holds: 0

Includes bibliographical references (p. 479-491) and index.

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