TY  - BOOK
AU  - Egerton, Ray F.
TI  - Physical principles of electron microscopy : an introduction to TEM, SEM and AEM
SN  - 978-1-4419-3837-4
U1  - 502.825 23rd.
PY  - 2010///
CY  - New York
PB  - Springer 
KW  - Electron microscopes
KW  - Electron microscopy
UR  - www.springeronline.com
ER  -