Egerton, Ray F. <br/><br/>
Physical principles of electron microscopy : an introduction to TEM, SEM and AEM 
Ray F. Egerton 
 - New York  Springer   2010 
 - xii,202p.:ill.;  23cm. 
<br/><br/><label>ISBN: </label>978-1-4419-3837-4 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopes<br/>Electron microscopy
<br/><br/><label>Dewey Class. No.: </label>502.825